产品介绍

SN54BCT8373A 具有八路 D 类锁存器的扫描测试设备

The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integrated- circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F373 and 'BCT373 octal D-type latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal latches

SN54BCT8373A 特性

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Octal Test-Integrated Circuits
• Functionally Equivalent to 'F373 and 'BCT373 in the Normal-Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPETM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)

SN54BCT8373A 芯片订购指南

SN54BCT8373A 质量与无铅数据

SN54BCT8373A 应用技术支持与电子电路设计开发资源下载

1. SN54BCT8373A 数据资料 dataSheet 下载.PDF
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