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SN74ABT18640 具有 18 位反向总线收发器的扫描测试设备

当前价格: ¥ 0.00/PCS
最小起订:2500PCS
供货总量:100001PCS
发 货 期:1天内发货
所 在 地: 中国 
发布时间:2012-07-31

BDTIC 代理商

商家等级:普通供应商

联系人:吴奇禄

电话:0755-83574989

地址:中国广东省深圳福田区华强北福虹路8号世贸广场B座12F

产品介绍

SN74ABT18640 具有 18 位反向总线收发器的扫描测试设备

The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells.

  SN74ABT18640
Voltage Nodes(V) 5  
Vcc range(V) 4.5 to 5.5  
Input Level TTL  
Logic Inv  
No. of Outputs 18  
Output Drive(mA) -32/64  
tpd max(ns) 5.4  
Output Level TTL  
Static Current 21.5  
Rating Catalog  
Technology Family ABT
SN74ABT18640 特性
  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Members of the Texas Instruments WidebusTM Family
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • SCOPETM Instruction Set
    • IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
    • Parallel-Signature Analysis at Inputs
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Device Identification
    • Even-Parity Opcodes
  • State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
  • Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages
SN74ABT18640 芯片订购指南
器件 状态 温度 价格(美元) 封装 | 引脚 封装数量 | 封装载体 丝印标记
74ABT18640DGGRE4 ACTIVE -40 to 85 13.42 | 1ku TSSOP (DGG) | 56 2000 | LARGE T&R  
74ABT18640DGGRG4 ACTIVE -40 to 85 13.42 | 1ku TSSOP (DGG) | 56 2000 | LARGE T&R  
SN74ABT18640DGGR ACTIVE -40 to 85 13.42 | 1ku TSSOP (DGG) | 56 2000 | LARGE T&R  
SN74ABT18640DL ACTIVE -40 to 85 13.42 | 1ku SSOP (DL) | 56 20 | TUBE  
SN74ABT18640DLG4 ACTIVE -40 to 85 13.42 | 1ku SSOP (DL) | 56 20 | TUBE  
SN74ABT18640 质量与无铅数据
器件 环保计划* 铅/焊球涂层 MSL 等级/回流焊峰 环保信息与无铅 (Pb-free) DPPM / MTBF / FIT 率
74ABT18640DGGRE4 Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM 74ABT18640DGGRE4 74ABT18640DGGRE4
74ABT18640DGGRG4 Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM 74ABT18640DGGRG4 74ABT18640DGGRG4
SN74ABT18640DGGR Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74ABT18640DGGR SN74ABT18640DGGR
SN74ABT18640DL Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74ABT18640DL SN74ABT18640DL
SN74ABT18640DLG4 Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74ABT18640DLG4 SN74ABT18640DLG4
SN74ABT18640 应用技术支持与电子电路设计开发资源下载
  1. SN74ABT18640 数据资料 dataSheet 下载.PDF
  2. TI 德州仪器特殊逻辑产品选型与价格 . xls
  3. Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
  4. Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
  5. TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
  6. Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
  7. CMOS Power Consumption and CPD Calculation (PDF 89 KB)
  8. Designing With Logic (PDF 186 KB)
  9. Live Insertion (PDF 150 KB)
  10. Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
  11. Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
  12. HiRel Unitrode Power Management Brochure (PDF 206 KB)
  13. LOGIC Pocket Data Book (PDF 6001 KB)
  14. HiRel Unitrode Power Management Brochure (PDF 206 KB)
  15. Logic Cross-Reference (PDF 2938 KB)
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