产品介绍

SN74ABT8543 具有八路寄存总线收发器的扫描测试设备

The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers

SN74ABT8543 特性

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Functionally Equivalent to 'F543 and 'ABT543 in the Normal-Function Mode
• SCOPETM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel-Signature Analysis at Inputs With Masking Option
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
  • Binary Count From Outputs
  • Even-Parity Opcodes
• Two Boundary-Scan Cells Per I/O for Greater Flexibility
• State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
• Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT)

SN74ABT8543 芯片订购指南

SN74ABT8543 质量与无铅数据

SN74ABT8543 应用技术支持与电子电路设计开发资源下载

1. SN74ABT8543 数据资料 dataSheet 下载.PDF
2. TI 德州仪器特殊逻辑产品选型与价格 . xls
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