产品介绍

SN74ABTH18502A 具有 18 位通用总线收发器的扫描测试设备

The 'ABTH18502A and 'ABTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells

SN74ABTH18502A 特性

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Members of the Texas Instruments WidebusTM Family
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• UBTTM (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode
• Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors
• B-Port Outputs of 'ABTH182502A Devices Have Equivalent 25- Series Resistors, So No External Resistors Are Required
• State-of-the-Art EPIC-IIBTM BiCMOS Design
• One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency
• SCOPE Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
  • Binary Count From Outputs
  • Device Identification
  • Even-Parity Opcodes
• Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings

SN74ABTH18502A 芯片订购指南

SN74ABTH18502A 质量与无铅数据

SN74ABTH18502A 应用技术支持与电子电路设计开发资源下载

1. SN74ABTH18502A 数据资料 dataSheet 下载.PDF
2. TI 德州仪器特殊逻辑产品选型与价格 . xls
3. Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
4. Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
5. TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
6. Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
7. CMOS Power Consumption and CPD Calculation (PDF 89 KB)
8. Designing With Logic (PDF 186 KB)
9. Live Insertion (PDF 150 KB)
10. Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
11. Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
12. HiRel Unitrode Power Management Brochure (PDF 206 KB)
13. LOGIC Pocket Data Book (PDF 6001 KB)
14. HiRel Unitrode Power Management Brochure (PDF 206 KB)
15. Logic Cross-Reference (PDF 2938 KB)