The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers
SN74BCT8240A | |
Voltage Nodes(V) | 5 |
Vcc range(V) | 4.5 to 5.5 |
Input Level | TTL |
Logic | Inv |
No. of Outputs | 8 |
Output Drive(mA) | -15/64 |
tpd max(ns) | 9 |
Output Level | TTL |
Static Current | 29.75 |
Rating | Catalog |
Technology Family | BCT |
器件 | 状态 | 温度 | 价格(美元) | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
SN74BCT8240ADW | ACTIVE | 0 to 70 | 9.50 | 1ku | SOIC(DW) | 24 | 25 | TUBE | |
SN74BCT8240ADWE4 | ACTIVE | 0 to 70 | 9.50 | 1ku | SOIC(DW) | 24 | 25 | TUBE | |
SN74BCT8240ADWG4 | ACTIVE | 0 to 70 | 9.50 | 1ku | SOIC(DW) | 24 | 25 | TUBE |
器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
SN74BCT8240ADW | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | SN74BCT8240ADW | SN74BCT8240ADW |
SN74BCT8240ADWE4 | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | SN74BCT8240ADWE4 | SN74BCT8240ADWE4 |
SN74BCT8240ADWG4 | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | SN74BCT8240ADWG4 | SN74BCT8240ADWG4 |
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