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SN74BCT8244A 具有八路缓冲器的 IEEE 标准 1149.1 (JTAG) 边界扫描测试设备

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最小起订:2500PCS
供货总量:10000PCS
发 货 期:1天内发货
所 在 地: 中国 
发布时间:2012-07-31

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SN74BCT8244A 具有八路缓冲器的 IEEE 标准 1149.1 (JTAG) 边界扫描测试设备

The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F244 and 'BCT244 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers

  SN74BCT8244A
Voltage Nodes(V) 5  
Vcc range(V) 4.5 to 5.5  
Input Level TTL  
Logic True  
No. of Outputs 8  
Output Drive(mA) -15/64  
tpd max(ns) 8.5  
Output Level TTL  
Static Current 29.75  
Rating Catalog  
Technology Family BCT
SN74BCT8244A 特性
  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Octal Test-Integrated Circuits
  • Functionally Equivalent to 'F244 and 'BCT244 in the Normal-Function Mode
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
  • Test Operation Synchronous to Test Access Port (TAP)
  • Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
  • SCOPETM Instruction Set
    • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP and HIGHZ
    • Parallel-Signature Analysis at Inputs
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
  • Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
SN74BCT8244A 芯片订购指南
器件 状态 温度 价格(美元) 封装 | 引脚 封装数量 | 封装载体 丝印标记
SN74BCT8244ADW ACTIVE 0 to 70 9.50 | 1ku SOIC(DW) | 24 25 | TUBE  
SN74BCT8244ADWE4 ACTIVE 0 to 70 9.50 | 1ku SOIC(DW) | 24 25 | TUBE  
SN74BCT8244ADWG4 ACTIVE 0 to 70 9.50 | 1ku SOIC(DW) | 24 25 | TUBE  
SN74BCT8244A 质量与无铅数据
器件 环保计划* 铅/焊球涂层 MSL 等级/回流焊峰 环保信息与无铅 (Pb-free) DPPM / MTBF / FIT 率
SN74BCT8244ADW Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74BCT8244ADW SN74BCT8244ADW
SN74BCT8244ADWE4 Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74BCT8244ADWE4 SN74BCT8244ADWE4
SN74BCT8244ADWG4 Green (RoHS & no Sb/Br)  CU NIPDAU  Level-1-260C-UNLIM SN74BCT8244ADWG4 SN74BCT8244ADWG4
SN74BCT8244A 应用技术支持与电子电路设计开发资源下载
  1. SN74BCT8244A 数据资料 dataSheet 下载.PDF
  2. TI 德州仪器特殊逻辑产品选型与价格 . xls
  3. Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
  4. Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
  5. TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
  6. Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
  7. CMOS Power Consumption and CPD Calculation (PDF 89 KB)
  8. Designing With Logic (PDF 186 KB)
  9. Live Insertion (PDF 150 KB)
  10. Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
  11. Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
  12. HiRel Unitrode Power Management Brochure (PDF 206 KB)
  13. LOGIC Pocket Data Book (PDF 6001 KB)
  14. HiRel Unitrode Power Management Brochure (PDF 206 KB)
  15. Logic Cross-Reference (PDF 2938 KB)
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