产品介绍

SN74BCT8245A 具有八路寄存总线收发器的扫描测试设备

The 'BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F245 and 'BCT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers

SN74BCT8245A 特性

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Octal Test-Integrated Circuits
• Functionally Equivalent to 'F245 and 'BCT245 in the Normal- Function Mode
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Test Operation Synchronous to Test Access Port (TAP)
• Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
• SCOPETM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
• Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)

SN74BCT8245A 芯片订购指南

SN74BCT8245A 质量与无铅数据

SN74BCT8245A 应用技术支持与电子电路设计开发资源下载

1. SN74BCT8245A 数据资料 dataSheet 下载.PDF
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